Tunneling and thermal emission of electrons from a distribution of shallow traps in SiO2

Applied Physics Letters

Volumn 58, Issue 12, 1991, Pages 1262-1264

  Thompson, Scott E ^a   Nishida, Toshikazu ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345221452     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.104330     Document Type: Article

References (15)