Electron and Hole Trapping in Irradiated SIMOX, ZMR and BESOI Buried Oxides

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 2086-2097

  Stahlbush, R E ^a   Campisi, G J ^a   McKitterick, J B ^b   Maszara, W P ^b   Roitman, P ^c   Brown, G A ^d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b AlliedSignal Tech Serv Corporation   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001598069     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211407     Document Type: Article

References (27)

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