Enhanced Damage in Linear Bipolar Integrated Circuits at Low Dose Rate

IEEE Transactions on Nuclear Science

Volumn 42, Issue 6, 1995, Pages 1650-1659

  Johnston, A H ^a   Rax, B G ^b   Lee, C I ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DOSIMETRY; LINEAR INTEGRATED CIRCUITS; RADIATION EFFECTS;

DOSE RATES; ENHANCED DAMAGE; JUNCTION ISOLATION; LATERAL PNP TRANSISTORS; LINEAR BIPOLAR INTEGRATED CIRCUITS;

BIPOLAR INTEGRATED CIRCUITS;

EID: 0029521843     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.488762     Document Type: Article

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