Trends in the Total-Dose Response of Modern Bipolar Transistors

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 2026-2035

  Nowlin, R N ^a   Schrimpf, R D ^a   Enlow, E W ^b   Combs, W E ^c  

^a UNIVERSITY OF ARIZONA   (United States)

^b MISSION RESEARCH CORPORATION   (United States)

^c NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84939758992     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211400     Document Type: Article

References (18)

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