Single Event Upset and Charge Collection Measurements Using High Energy Protons and Neutrons

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 2203-2209

  Normand, E ^a   Oberg, D L ^a   Wert, J L ^a   Ness, J D ^a   Majewski, P P ^a   Wender, S ^b   Gavron, A ^b  

^a BOEING COMPANY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL EQUIPMENT; MICROELECTRONICS; NEUTRONS; PARTICLE ACCELERATORS; PROTONS; RADIATION DETECTORS; RANDOM ACCESS STORAGE; SPECTRUM ANALYSIS;

MICROCONTROLLERS; SINGLE EVENT UPSET; SURFACE BARRIER DETECTORS;

RADIATION EFFECTS;

EID: 0028705539     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340563     Document Type: Article

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