Piezoelectric hysteresis measurement using atomic force microscopy

Integrated Ferroelectrics

Volumn 38, Issue 1-4, 2001, Pages 31-38

  Shin, Hyunjung ^a   Shin, Jung Kyu ^a   Hong, Seungbum ^a   Jeon, Jong Up ^a   Song, Han Wook ^b   Hong, Jong In ^b   No, Kwangsoo ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Atomic force microscopy; Local piezoelectric hysteresis loop; Piezoelectric coefficient; Piezoelectric thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; PIEZOELECTRIC DEVICES; SOL-GEL PROCESS; SPUTTERING; THIN FILMS;

COERCIVE VOLTAGES; HARMONIC SIGNAL; PIEZOELECTRIC COEFFICIENT;

HYSTERESIS LOOPS;

EID: 0012069714     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580108016915     Document Type: Article

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