Piezoelectric response of epitaxial Pb(Zr0.2Ti0.8)O3 films measured by scanning tunneling microscopy

Applied Physics Letters

Volumn 77, Issue 11, 2000, Pages 1701-1703

  Kuffer, O ^a   Maggio Aprile, I ^a   Triscone, J M ^a   Fischer, O ^a   Renner, Ch ^b  

^a UNIVERSITY OF GENEVA   (Switzerland)

^b NEC LABORATORIES AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000754197     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1309017     Document Type: Article

References (28)

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