Characterization of switching properties of lead-zirconate-titanate thin films in Ti-rich phase

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 37, Issue 5 PART A, 1998, Pages

  Aoki, Katsuhiro ^a   Sakoda, Tomoyuki ^a   Fukuda, Yukio ^a  

^a Texas Instruments Japan Ltd   (Japan)

Author keywords

PZT; Remanent polarization; Sawyer Tower circuit; Switching; Ti Zr ratio

Indexed keywords

CAPACITORS; CERAMIC MATERIALS; CHARACTERIZATION; ELECTRIC CURRENTS; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; PHYSICAL PROPERTIES; POLARIZATION; SWITCHING;

REMANENT POLARIZATION DENSITY; SAWYER-TOWER CIRCUIT; SWITCHING TRANSIENT CURRENT;

THIN FILMS;

EID: 0032069697     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.l522     Document Type: Article

References (3)

1. D. Wouters, G. Norga, F. Beckers, L. Bogaerts and H. Haes: Scaling of Sol-Gel PZT Ferroelectric Capacitor for Low-Voltage Operation, The IMEC Publications on Ferroelectrics, May 1997.
2. L. L. Boyer, N. Velasquez and J. T. Evans: Jpn. J. Appl. Phys. 36 (1997) 5799.
3. K. Aoki, K. Numata, Y. Fukuda and A. Nishimura: Jpn. J. Appl. Phys. 35 (1996) 2210.