Strained InGaAs/GaPAsSb heterostructures grown on GaAs (001) for optoelectronic applications in the 1100–1550 nm range

Journal of Applied Physics

Volumn 88, Issue 5, 2000, Pages 3004-3014

  Braun, W ^a   Dowd, P ^a   Guo, C Z ^a   Chen, S L ^a   Ryu, C M ^a   Koelle, U ^a   Johnson, S R ^a   Zhang, Y H ^a   Tomm, J W ^b   Elsasser T ^b   Smith, D J ^c  

^a Arizona State University   (United States)

^b MAX BORN INSTITUT   (Germany)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000345538     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.1287233     Document Type: Article

References (28)

1. J. Piprek and S. J. B. Yoo, Electron. Lett. ELLEAK 30, 866 (1994).
2. T. Chung, N. Hosoda, T. Suga, and H. Takagi, Appl. Phys. Lett. APPLAB 72, 1565 (1998).
3. J. J. Dudley, D. I. Babic, L. Yang, R. Mirin, B. I. Miller, R. J. Ram, T. Reynolds, E. L. Hu, and J. E. Bowers, Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS ’93 Conference Proceedings, IEEE, 1993, pp. 560–561.
4. J. Behrend et al., J. Cryst. Growth JCRGAE 188, 295 (1998).
5. R. P. Mirin et al., Appl. Phys. Lett. APPLAB 67, 3795 (1995).
6. K. Nishi, H. Saito, S. Sugou, and J.-S. Lee, Appl. Phys. Lett. APPLAB 74, 1111 (1999).
7. D. L. Huffaker et al., Appl. Phys. Lett. APPLAB 73, 2564 (1998).
8. D. L. Huffaker, H. Deng, and D. G. Deppe, IEEE Photonics Technol. Lett. IPTLEL 10, 185 (1998).
9. M. Yamada, T. Anan, K. Tokutome, K. Nishi, A. Gomyo, S. Sugou, Lasers and Electro-Optics Society Annual Meeting, 1998, LEOS’98, IEEE, Vol. 1, pp. 149–150.
10. K. Nakahara et al., IEEE Photonics Technol. Lett. IPTLEL 10, 487 (1998).
11. M. Peter et al., Appl. Phys. Lett. APPLAB 67, 2639 (1995).
12. M. Peter et al., J. Electron. Mater. JECMA5 24, 1551 (1995).
13. J. Meyer, C. Hoffman, F. Bartoli, and L. Ram-Mohan, Appl. Phys. Lett. APPLAB 67, 757 (1996).
14. A. N. Baranov et al., Electron. Lett. ELLEAK 32, 2279 (1996).
15. A. N. Baranov et al., Electron. Lett. ELLEAK 34, 281 (1998).
16. J. Malin et al., Appl. Phys. Lett. APPLAB 68, 2976 (1996).
17. D. Nelson, R. C. Miller, and D. Kleinman, Phys. Rev. B PRBMDO 35, 7770 (1987).
18. G. Salviati et al., The Proceedings of the 17th Congress on Electron Microscopy, Italian Society, Lecce 2730, 1989 (unpublished).
19. C. van de Walle, Phys. Rev. B PRBMDO 39, 1871 (1989).
20. D. Kleinman and R. Miller, Phys. Rev. B PRBMDO 32, 2266 (1985).
21. S. Corzine, R. Yan, and L. Coldren, Appl. Phys. Lett. APPLAB 57, 2835 (1990).
22. W. Braun, H. Möller, and Y.-H. Zhang, Appl. Phys. Lett. APPLAB 74, 138 (1999).
23. F. Hatami et al., Appl. Phys. Lett. APPLAB 67, 656 (1995).
24. B. J. Ohlsson and M. S. Miller, J. Cryst. Growth JCRGAE 188, 387 (1998).
25. H. Raether, in Encyclopedia of Physics, edited by S. Flügge (Springer, Berlin, 1957), pp. 512–515 (in German).
26. E. R. Glaser, B. R. Bennett, B. V. Shanabrook, and R. Magno, Appl. Phys. Lett. APPLAB 68, 3614 (1996).
27. A. Chin and W. J. Chen, Appl. Phys. Lett. APPLAB 69, 443 (1996).
28. Y.-H. Zhang, R. Miles, and D. H. Chow, IEEE J. Sel. Top. Quantum Electron. IJSQEN 1, 749 (1995).