Microwave-mixing scanning capacitance microscopy of pn junctions

Journal of Applied Physics

Volumn 86, Issue 12, 1999, Pages 7094-7099

  Schmidt, J ^a,b   Rapoport, D H ^b   Behme, G ^b   Frohlich H J ^b  

^a HUMBOLDT UNIVERSITY   (Germany)

^b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000253458     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371797     Document Type: Article

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