SCOPUS 정보 검색 플랫폼

Volumn 573, Issue 1, 2004, Pages 1-10

Measurement of electron transport properties of molecular junctions fabricated by electrochemical and mechanical methods

(8) Li, X L a He, H X a Xu, B Q a Xiao, X Y a Nagahara, L A b Amlani, I b Tsui, R b Tao, N J a

a Arizona State University (United States)

b MOTOROLA INC (United States)

Author keywords

Electrical transport measurements; Electrochemical methods

Indexed keywords

DEPOSITION; ELECTROCHEMISTRY; ELECTRODES; ELECTRON TUNNELING; ETCHING; OXIDATION; SILICON;

ELECTRICAL TRANSPORT MEASUREMENTS; ELECTROCHEMICAL METHODS; MOLECULAR JUNCTIONS; MOLECULAR SCALE GAP;

ELECTRON BEAM LITHOGRAPHY;

EID: 9944233945 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2004.04.061 Document Type: Conference Paper

Times cited : (20)

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