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Volumn 16, Issue 4, 1998, Pages 2494-2498

Chemically and geometrically enhanced focused ion beam micromachining

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001236893     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590197     Document Type: Article
Times cited : (49)

References (21)
  • 12
  • 17
    • 11644288071 scopus 로고    scopus 로고
    • Masters thesis, North Carolina State University, Raleigh, NC
    • D. M. Thaus, Masters thesis, North Carolina State University, Raleigh, NC, 1996.
    • (1996)
    • Thaus, D.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.