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Volumn , Issue , 2014, Pages 125-155

XMAS: A versatile tool for analyzing synchrotron X-ray microdiffraction data

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; DIFFRACTION; DISLOCATIONS (CRYSTALS); INDEXING (OF INFORMATION);

EID: 85013498175     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1142/9781908979636_0004     Document Type: Chapter
Times cited : (110)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.