Application of white x-ray microbeams for the analysis of dislocation structures

Review of Scientific Instruments

Volumn 73, Issue 3 II, 2002, Pages 1652-

  Barabash, R I ^a   Ice, G E ^a   Larson, B C ^a   Yang, Wenge ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

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Indexed keywords

EID: 0036494702     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1445830     Document Type: Conference Paper

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