-
1
-
-
84858421133
-
-
Lawrence Berkeley National Laboratory, USA
-
MacDowell A A, R S Celestre1, N Tamura, R Spolenak, B Valek, W L Brown, J C Bravman, H A Padmore, B W Batterman and J R Patel 2000 Submicron X-ray Diffraction, http://escholarship.org/uc/item/2f47k34b, Lawrence Berkeley National Laboratory, USA
-
(2000)
Submicron X-ray Diffraction
-
-
MacDowell, A.A.1
Celestre, R.S.2
Tamura, N.3
Spolenak, R.4
Valek, B.5
Brown, W.L.6
Bravman, J.C.7
Padmore, H.A.8
Batterman, B.W.9
Patel, J.R.10
-
2
-
-
79952429167
-
Advanced light source
-
Lawrence Berkeley National Laboratory, USA
-
Advanced Light Source. X-ray Microdiffraction Analysis Software (XMAS), http://xraysweb.lbl.gov/microdif/user-resources.htm, Lawrence Berkeley National Laboratory, USA, 2010
-
(2010)
X-ray Microdiffraction Analysis Software (XMAS)
-
-
-
3
-
-
84858411742
-
Advanced photon source
-
Argonne National Laboratory, USA
-
Advanced Photon Source. 3D X-ray Microdiffraction Analysis Software Package, http://www.aps.anl.gov/Sectors/33-34/microdiff/downloads/, Argonne National Laboratory, USA, 2009
-
(2009)
3D X-ray Microdiffraction Analysis Software Package
-
-
-
4
-
-
0034503619
-
Estimation of the background in powder diffraction patterns through a robust smoothing procedure
-
DOI 10.1107/S0021889800003617
-
Sergio Brückner 2000 Estimation of the Background in Powder Diffraction Patterns through a Robust Smoothing Procedure J. Appl. Crystallography 2 33 (3) 977-979 Jun (Pubitemid 32120487)
-
(2000)
Journal of Applied Crystallography
, vol.33
, Issue.3
, pp. 977-979
-
-
Bruckner, S.1
-
6
-
-
79952397593
-
-
IBM
-
IBM. IBM InfoSphere Streams, http://www-01.ibm.com/software/data/ infosphere/streams/, 2010
-
(2010)
IBM InfoSphere Streams
-
-
-
7
-
-
0000581383
-
Automated indexing for texture and strain measurement with broad-band pass X-ray micro-beams
-
Chung J and G Ice 1999 Automated Indexing for Texture and Strain Measurement with Broad-band Pass X-ray Micro-beams J. Appl. Phys. 86 (9)
-
(1999)
J. Appl. Phys.
, vol.86
, Issue.9
-
-
Chung, J.1
Ice, G.2
-
8
-
-
79952398747
-
Accelerated Synchrotron X-ray Diffraction Data Analysis on a Heterogeneous High Performance Computing System
-
Qin J and M A Bauer 2010 Accelerated Synchrotron X-ray Diffraction Data Analysis on a Heterogeneous High Performance Computing System J. Phys.: Conf. Ser. 256 012007
-
(2010)
J. Phys.: Conf. Ser.
, vol.256
, Issue.1
, pp. 012007
-
-
Qin, J.1
Bauer, M.A.2
-
9
-
-
84858417778
-
-
Oak Ridge National Lab, TischlerJZ@ornl.gov
-
Jon Tischler 2010 WinView, Oak Ridge National Lab, TischlerJZ@ornl.gov
-
(2010)
WinView
-
-
Tischler, J.1
-
10
-
-
79952401009
-
A pipelining implementation for parsing X-ray diffraction source data and removing the background noise
-
Bauer M A, A Biem, S McIntyre and Y Xie 2010 A Pipelining Implementation for Parsing X-ray Diffraction Source Data and Removing the Background Noise J. Phys.: Conf. Ser. 256 012017
-
(2010)
J. Phys.: Conf. Ser.
, vol.256
, Issue.1
, pp. 012017
-
-
Bauer, M.A.1
Biem, A.2
McIntyre, S.3
Xie, Y.4
-
11
-
-
0037366817
-
Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films
-
DOI 10.1107/S0909049502021362
-
Tamura N and A A MacDowell and R Spolenak and B C Valek and J C Bravman and W L Brown and R S Celestre and H A Padmore and B W Batterman and J R Patel 2003 Scanning X-ray Microdiffraction with Submicrometer White Beam for Strain/Stress and Orientation Mapping in Thin Films J. Synchrotron Rad. 10 137-143 (Pubitemid 36515752)
-
(2003)
Journal of Synchrotron Radiation
, vol.10
, Issue.2
, pp. 137-143
-
-
Tamura, N.1
MacDowell, A.A.2
Spolenak, R.3
Valek, B.C.4
Bravman, J.C.5
Brown, W.L.6
Celestre, R.S.7
Padmore, H.A.8
Batterman, B.W.9
Patel, J.R.10
-
12
-
-
0033284877
-
Strain and texture in Al-interconnect wires measured by X-ray microbeam diffraction
-
Tamura N and J-S Chung and G E Ice and B C Larson and J D Budai and J Z Tischler and M Yoon 1999 Strain and Texture in Al-Interconnect Wires Measured by X-ray Microbeam Diffraction Mater. Res. Soc. Symp. 563 175-180 (Pubitemid 32081914)
-
(1999)
Materials Research Society Symposium - Proceedings
, vol.563
, pp. 175-180
-
-
Tamura Nobumichi1
Chung, J.-S.2
Ice, G.E.3
Larson, B.C.4
Budai, J.D.5
Tischler, J.Z.6
Yoon, M.7
Williams, E.L.8
Lowe, W.P.9
-
13
-
-
2942579313
-
Quantitative Characterization of Electromigration-induced Plastic Deformation in Al(0.5 wt%Cu) Interconnect
-
Barabash R I, G E Ice, N Tamura, B C Valek, J C Bravman, R Spolenak and J R Patel 2004 Quantitative Characterization of Electromigration-induced Plastic Deformation in Al(0.5 wt%Cu) Interconnect Microelectron Eng. 75 (1) 24-30
-
(2004)
Microelectron Eng.
, vol.75
, Issue.1
, pp. 24-30
-
-
Barabash, R.I.1
Ice, G.E.2
Tamura, N.3
Valek, B.C.4
Bravman, J.C.5
Spolenak, R.6
Patel, J.R.7
-
14
-
-
84858437222
-
-
Silicon Graphics, Inc.
-
Sam Leffler 2004 libtiff 3.8.2, ftp://ftp.remotesensing.org/pub/libtiff/ Silicon Graphics, Inc.
-
(2004)
Libtiff 3.8.2
-
-
Leffler, S.1
|