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Volumn 44, Issue 1, 2011, Pages 177-183
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Determining the energy-dependent X-ray flux variation of a synchrotron beamline using Laue diffraction patterns
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Author keywords
incident flux; Laue; microdiffraction
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Indexed keywords
BENDING MAGNETS;
DEBYE WALLER FACTOR;
ENERGY DEPENDENT;
FLUX VARIATION;
HIGHLY SENSITIVE;
INCIDENT ENERGY;
INCIDENT FLUX;
INTENSITY VARIATIONS;
LAUE;
LAUE DIFFRACTION PATTERNS;
MICRODIFFRACTIONS;
SPECTRAL RANGE;
SYNCHROTRON BEAMLINES;
X-RAY FLUX;
CARBONATE MINERALS;
DIFFRACTION PATTERNS;
INTERFEROMETRY;
QUARTZ;
SUPERCONDUCTING MAGNETS;
X RAY DIFFRACTION;
CRYSTAL STRUCTURE;
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EID: 79251474024
PISSN: 00218898
EISSN: 16005767
Source Type: Journal
DOI: 10.1107/S0021889810052015 Document Type: Article |
Times cited : (10)
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References (17)
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