메뉴 건너뛰기




Volumn 44, Issue 1, 2011, Pages 177-183

Determining the energy-dependent X-ray flux variation of a synchrotron beamline using Laue diffraction patterns

Author keywords

incident flux; Laue; microdiffraction

Indexed keywords

BENDING MAGNETS; DEBYE WALLER FACTOR; ENERGY DEPENDENT; FLUX VARIATION; HIGHLY SENSITIVE; INCIDENT ENERGY; INCIDENT FLUX; INTENSITY VARIATIONS; LAUE; LAUE DIFFRACTION PATTERNS; MICRODIFFRACTIONS; SPECTRAL RANGE; SYNCHROTRON BEAMLINES; X-RAY FLUX;

EID: 79251474024     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810052015     Document Type: Article
Times cited : (10)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.