A Novel Highly Integrated SPM System for Single Molecule Studies

IEEE Sensors Journal

Volumn 10, Issue 3, 2010, Pages 485-491

  Chen, Fan ^a   Xu, Bingqian ^a   Zhou, Jianfeng ^a   Chen, Guojun ^a  

^a University of Georgia   (United States)

Author keywords

Atomic force microscope (AFM); conductance; contact force; molecular junctions; single molecule

Indexed keywords

EID: 85008020242     PISSN: 1530437X     EISSN: 15581748     Source Type: Journal    
DOI: 10.1109/JSEN.2009.2037796     Document Type: Article

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