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Volumn 8, Issue 1, 2008, Pages 345-349

Formation and self-breaking mechanism of stable atom-sized junctions

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; FABRICATION; GOLD; MOLECULAR MASS; STRAIN RATE;

EID: 38749128677     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl073003j     Document Type: Article
Times cited : (137)

References (30)
  • 22
    • 38749090719 scopus 로고    scopus 로고
    • We note that bias-induced local heating plays a minimal role on the atomic diffusion rates for Teff, T0, 293 K from eq 2 since Tv ≪ T0 at 0.1 V, due to efficient lattice thermal cooling of the contacts.23
    • 23


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.