The ATHENA optics development

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 9905, Issue , 2016, Pages

  Bavdaz, Marcos ^a   Wille, Eric ^a   Shortt, Brian ^a   Fransen, Sebastiaan ^a   Collon, Maximilien ^b   Barriere, Nicolas ^c   Yanson, Alexei ^c   Vacanti, Giuseppe ^c   Haneveld, Jeroen ^d   Van Baren, Coen ^e   Zuknik, Karl Heinz ^f   Christensen, Finn ^g   Della Monica Ferreira, Desiree ^g   Krumrey, Michael ^h   Burwitz, Vadim ⁱ   Pareschi, Giovanni ^j   Spiga, Daniele ^j   Valsecchi, Giuseppe ^k   Vernani, Dervis ^l  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b Cosine Research BV ^*  (Netherlands)

^c Cosine Science and Computing BV ^*  (Netherlands)

^d Micronit Microfluidics   (Netherlands)

^e SRON NETHERLANDS INSTITUTE FOR SPACE RESEARCH   (Netherlands)

^f OHB SYSTEM AG   (Germany)

^g TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^h PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

ⁱ MPI F Extraterrestrische Physik   (Germany)

^j INAF OSSERVATORIO ASTRONOMICO DI BRERA   (Italy)

^k Media Lario Technologies Srl   (Italy)

^l RUAG Space   (Switzerland)

more..

Author keywords

ATHENA; Silicon Pore Optics; Technology preparation; X ray astronomy; X ray optics; X ray telescopes; X ray testing

Indexed keywords

ASTROPHYSICS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SPACE TELESCOPES; X RAY OPTICS;

ATHENA; PORE OPTICS; X RAY TELESCOPE; X-RAY ASTRONOMY; X-RAY TESTING;

GAMMA RAYS;

EID: 85003520589     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2233037     Document Type: Conference Paper

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