Performance characterization of silicon pore optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6266 I, Issue , 2006, Pages

  Collon, M J ^a   Kraft, S ^a   Gunther R ^e   Maddox, E ^e   Beijersbergen, M ^a   Bavdaz, M ^b   Lumb, D ^b   Wallace, K ^b   Krumrey, M ^c   Cibik, L ^c   Freyberg, M ^d  

^a Cosine Research BV ^*  (Netherlands)

^b EUROPEAN SPACE AGENCY   (Netherlands)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^d MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^e NONE

Author keywords

Pore optics; Silicon; Stack; Wafer; X ray astronomy; X ray optics

Indexed keywords

ASTRONOMY; MIRRORS; OPTICAL RESOLVING POWER; SILICON WAFERS; SPACE OPTICS; SPACE TELESCOPES;

AUTOMATED ASSEMBLY PROCESS; HIGH PERFORMANCE PORE OPTICS (HPO); PRODUCTION PROCESS; X-RAY TELESCOPES;

X RAY OPTICS;

EID: 33749018232     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.673268     Document Type: Conference Paper

References (10)

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9. See other papers in this session.
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