Design, fabrication, and characterization of silicon pore optics for ATHENA/IXO

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8147, Issue , 2011, Pages

  Collon, Maximilien J ^a   Günther, Ramses ^a   Ackermann, Marcelo ^a   Partapsing, Rakesh ^a   Vacanti, Giuseppe ^b   Beijersbergen, Marco W ^a   Bavdaz, Marcos ^c   Wallace, Kotska ^c   Wille, Erik ^c   Olde Riekerink, Mark ^c   Haneveld, Jeroen ^d   Koelewijn, Arenda ^d   Van Baren, Coen ^e   Müller, Peter ^f   Krumrey, Michael ^f   Freyberg, Michael ^g   Jakobsen, Anders C ^h   Christensen, Finn ^h  

^a Cosine Research BV ^*  (Netherlands)

^b Cosine Science and Computing BV ^*  (Netherlands)

^c EUROPEAN SPACE AGENCY   (Netherlands)

^d Micronit Microfluidics   (Netherlands)

^e SRON NETHERLANDS INSTITUTE FOR SPACE RESEARCH   (Netherlands)

^f PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^g MPI F Extraterrestrische Physik   (Germany)

^h TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

pore optics; silicon; stack; wafer; X ray astronomy; X ray optics; X ray telescopes

Indexed keywords

PORE OPTICS; STACK; WAFER; X RAY TELESCOPE; X-RAY ASTRONOMY;

ASTROPHYSICS; DESIGN; GAMMA RAYS; LIGHT; MIRRORS; MULTIPHOTON PROCESSES; OPTICAL TELESCOPES; OPTICS; SEMICONDUCTING SILICON COMPOUNDS; SPACE FLIGHT; SPACECRAFT EQUIPMENT; SURFACE ROUGHNESS; TELESCOPES; X RAYS;

SILICON WAFERS;

EID: 80355139359     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.893418     Document Type: Conference Paper

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