New X-ray parallel beam facility XPBF 2.0 for the characterization of silicon pore optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 9905, Issue , 2016, Pages

  Krumrey, Michael ^a   Müller, Peter ^a   Cibik, Levent ^a   Collon, Max ^b   Barrière, Nicolas ^b   Vacanti, Giuseppe ^b   Bavdaz, Marcos ^c   Wille, Eric ^c  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b Cosine Research BV ^*  (Netherlands)

^c EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

ATHENA; Silicon Pore Optics; Synchrotron Radiation; XPBF

Indexed keywords

SILICON; SPACE TELESCOPES; SYNCHROTRON RADIATION; SYNCHROTRONS;

ATHENA; FOCUSING PROPERTIES; PHYSIKALISCH-TECHNISCHE BUNDESANSTALT; PORE OPTICS; SAMPLE-TO-DETECTOR DISTANCE; SYNCHROTRON RADIATION FACILITY; X RAY OBSERVATORIES; XPBF;

GAMMA RAYS;

EID: 85003441357     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2231687     Document Type: Conference Paper

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