Qualification of silicon pore optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 9144, Issue , 2014, Pages

  Wille, Eric ^a   Bavdaz, Marcos ^a   Fransen, Sebastiaan ^a   Collon, Maximilien ^b   Ackermann, Marcelo ^b   Guenther, Ramses ^b   Chatbi, Abdelhakim ^b   Vacanti, Giuseppe ^c   Vervest, Mark ^c   Van Baren, Coen ^d   Haneveld, Jeroen ^e   Riekerink, Mark Olde ^e   Koelewijn, Arenda ^e   Kampf, Dirk ^f   Zuknik, Karl Heinz ^f   Reutlinger, Arnd ^f  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b Cosine Research BV ^*  (Netherlands)

^c Cosine Science and Computing BV ^*  (Netherlands)

^d SRON NETHERLANDS INSTITUTE FOR SPACE RESEARCH   (Netherlands)

^e Micronit Microfluidics   (Netherlands)

^f OHB SYSTEM AG   (Germany)

Author keywords

environmental testing; pore optics; X ray astronomy; X ray optics; X ray telescopes

Indexed keywords

DESIGN; ENVIRONMENTAL TESTING; MIRRORS; MOUNTINGS; OPTICAL TESTING; SILICON; SPACE FLIGHT; SPACE TELESCOPES; X RAY OPTICS;

DESIGN MODIFICATIONS; ENABLING TECHNOLOGIES; PORE OPTICS; QUALIFICATION PROCESS; QUALIFICATION TEST; THERMAL LIMITATIONS; X RAY TELESCOPE; X-RAY ASTRONOMY;

GAMMA RAYS;

EID: 84922564267     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2055950     Document Type: Conference Paper

References (6)

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5. M. Ackermann et al., Proc. SPIE 7732, 77322T (2010).
6. M. Krumrey et al., Proc. SPIE 7732, 77324O (2010).