Metrology, integration and performance verification of silicon pore optics in Wolter-I configuration

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6266 I, Issue , 2006, Pages

  Collon, M J ^a   Kraff, S ^a   Gunther R ^a   Partapsing, R ^a   Beijersbergen, M ^a   Baren, C V ^b   Bavdaz, M ^c   Wallace, K ^c   Kampf, D ^d   Krumrey, M ^e   Muller P ^e  

^a Cosine Research BV ^*  (Netherlands)

^b SRON NETHERLANDS INSTITUTE FOR SPACE RESEARCH   (Netherlands)

^c EUROPEAN SPACE AGENCY   (Netherlands)

^d OHB SYSTEM AG   (Germany)

^e PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Pore optics; Silicon; Stack; Wafer; X ray astronomy; X ray optics; XOU

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; MEASUREMENTS; SILICON; SPACE OPTICS; X RAY OPTICS;

PORE OPTICS; X-RAY ASTRONOMY; XOU;

SPACE TELESCOPES;

EID: 33748991168     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.673269     Document Type: Conference Paper

References (8)

1. 'The XEUS X-ray telescope', M. Bavdaz et al, Proc. of SPIE 5900-35, San Diego, 2004
2. 'Silicon Pore Optics: novel lightweight high-resolution X-ray optics developed for XEUS', M. Beijersbergen et al, Proc. of SPIE 5488-137, San Diego, 2004
3. 'Production of silicon pore optics', R. Günther et al, Proc. of SPIE 6266-46, Orlando 2006
4. 'Development of modular High-performance Pore Optics for the XEUS x-ray telescope', S. Kraft et al, Proc. of SPIE-5900-53, San Siego, 2005
5. 'Performance characterisation of silicon pore optics', M. Collon et al, Proc. of SPIE 6266-66, Orlando 2006
6. Wolter, H. Ann der Phys 6 Fol Band 10, 1952
7. A. L. Mieremet and M. W. Beijersbergen, "Fundamental spatial resolution of an x-ray pore optic," Appl. Opt. 44, 7098-7105 (2005).
8. 'Programmatics of large scale production of silicon pore optics for future X-ray telescopes', S. Kraft et al, Proc. of SPIE 6266-130, Orlando 2006