Potential of the PANTER X-ray test facility for calibration of instrumentation for XEUS

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6266 II, Issue , 2006, Pages

  Freyberg, Michael ^a   Budau, Bernd ^a   Burkert, Wolfgang ^a   Hartner, Gisela ^a   Hasinger, Günther ^a   Collon, Maximilien ^b   Kraft, Stefan ^b   Beijersbergen, Marco ^b   Bavdaz, Marcos ^c   Lumb, David ^c   Wallace, Kotska ^c   Kampf, Dirk ^d  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b Cosine Research BV ^*  (Netherlands)

^c EUROPEAN SPACE AGENCY   (Netherlands)

^d OHB SYSTEM AG   (Germany)

Author keywords

Calibration; Mirrors; Panter; Pore optics; X rays; XEUS

Indexed keywords

ASTRONOMY; CAMERAS; CHARGE COUPLED DEVICES; ELECTRON TUBES; OPTICAL RESOLVING POWER; THERMAL EFFECTS;

FOCAL PLANE DETECTORS; INSTRUMENT CHAMBERS; PORE OPTICS; XEUS;

X RAY OPTICS;

EID: 33748993989     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.673300     Document Type: Conference Paper

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