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Volumn 7437, Issue , 2009, Pages
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Silicon pore optics development
a a a b b b b c c c c |
Author keywords
Ixo; Silicon pore optics; X ray optics; Xeus
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Indexed keywords
CURRENT TECHNOLOGY;
EUROPEAN INDUSTRY;
HIGH ANGULAR RESOLUTIONS;
IXO;
LARGE APERTURE;
LOW MASS;
MIRROR ASSEMBLY;
MIRROR DESIGN;
MIRROR MATERIALS;
NOVEL PROCESS;
PORE OPTICS;
REFLECTING MIRRORS;
ROADMAP;
TEST RESULTS;
X RAY MIRRORS;
X-RAY ASTROPHYSICS;
X-RAY OBSERVATORY;
XEUS;
ASTRONOMICAL SATELLITES;
ASTROPHYSICS;
MIRRORS;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
TECHNOLOGICAL FORECASTING;
ULTRAVIOLET DEVICES;
X RAYS;
GAMMA RAYS;
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EID: 70449369447
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.825824 Document Type: Conference Paper |
Times cited : (43)
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References (3)
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