New ray-tracing capabilities for the development of silicon pore optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 9603, Issue , 2015, Pages

  Vacanti, Giuseppe ^a   Barrière, Nicolas ^a   Chatbi, Abdelhakim ^a   Collon, Maximilien ^a   Günther, Ramses ^a   Yanson, Alexei ^a   Vervest, Mark ^a   Bavdaz, Marcos ^b   Wille, Eric ^b  

^a Cosine Science and Computing BV ^*  (Netherlands)

^b EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

ray tracing; Silcon Pore Optics; X ray astronomy; X ray optics; X ray telescopes; X ray testing

Indexed keywords

RAY TRACING; STRESSES; X RAY OPTICS;

PORE OPTICS; SURFACE METROLOGY; THERMO-MECHANICAL STRESS; X RAY TELESCOPE; X-RAY ASTRONOMY; X-RAY TESTING;

GAMMA RAYS;

EID: 84951769521     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2188133     Document Type: Conference Paper

References (6)

1. Agostinelli, S. et al., "GEANT4: A Simulation toolkit," Nucl. Instrum. Meth. A506, 250-303 (2003).
2. Vacanti, G., Buis, E.-J., Collon, M., Beijersbergen, M., and Kelly, C., "A generic x-ray tracing toolbox in Geant4," in [Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series], Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series 7360, 0 (May 2009).
3. Buis, E. J. and Vacanti, G., "X-ray tracing using Geant4," Nuclear Instruments and Methods in Physics Research A 599, 260-263 (Feb. 2009).
4. Krumrey, M., Cibik, L., Müller, P., Bavdaz, M., Wille, E., Ackermann, M., and Collon, M. J., "X-ray pencil beam facility for optics characterization," in [Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series], Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series 7732, 4 (July 2010).
5. Vacanti, G., Ackermann, M., Vervest, M., Collon, M., Günther, R., Kelly, C., Wille, E., Cibik, L., Krumrey, M., and Müller, P., "X-ray pencil beam characterization of silicon pore optics," in [Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series], Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series 8861, 1 (Sept. 2013).
6. Burwitz, V., Bavdaz, M., Pareschi, G., Collon, M., Burkert, W., Spiga, D., Hartner, G., Ackermann, M., Menz, B., and Civitani, M., "In focus measurements of IXO type optics using the new PANTER x-ray test facility extension," in [Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series], Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series 8861, 1 (Sept. 2013).