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Volumn 24, Issue 15, 1999, Pages 1005-1007
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Observation of nanometer-scale optical property discrimination by use of a near-field scanning apertureless microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001141830
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.24.001005 Document Type: Article |
Times cited : (24)
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References (12)
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