Modulated shear-force distance control in near-field scanning optical microscopy

Review of Scientific Instruments

Volumn 71, Issue 3, 2000, Pages 1466-1471

  Brunner, R ^a,b   Simon, A ^b   Stifter, T ^b   Marti, O ^b  

^a CARL ZEISS SMT AG   (Germany)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000727986     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150481     Document Type: Article

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