A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope

Review of Scientific Instruments

Volumn 67, Issue 10, 1996, Pages 3567-3572

  Lieberman, Klony ^a   Ben Ami, Nily ^a   Lewis, Aaron ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON DIOXIDE LASERS; CHARGE COUPLED DEVICES; CHROMOSOMES; CONTROL SYSTEMS; LIGHT POLARIZATION; OPTICAL FIBERS; OPTICAL MICROSCOPY; SCANNING;

NEAR FIELD SCANNING OPTICAL MICROSCOPE; PIEZOELECTRIC SCANNER; SCANNED PROBE MICROSCOPY;

MICROSCOPES;

EID: 0030262921     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147175     Document Type: Article

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