Reconstruction of height of sub-nanometer steps with bimodal atomic force microscopy

Nanotechnology

Volumn 27, Issue 7, 2016, Pages

  Lai, Chia Yun ^a   Santos, Sergio ^a   Chiesa, Matteo ^a  

^a KHALIFA UNIVERSITY   (United Arab Emirates)

Author keywords

afm; bimodal; height; terraces

Indexed keywords

VAN DER WAALS FORCES;

AFM; BIMODAL; HEIGHT; IMAGE MODELING; TERRACES; TOPOGRAPHIC IMAGES; TOPOGRAPHIC MEASUREMENTS; VAN DER WAALS THEORY;

ATOMIC FORCE MICROSCOPY;

EID: 84955438575     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/27/7/075701     Document Type: Article

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