Chemical potential fluctuations in topological insulator (Bi0.5Sb0.5)2)Te3-films visualized by photocurrent spectroscopy

2D Materials

Volumn 2, Issue 2, 2015, Pages

  Kastl, Christoph ^a,b   Seifert, Paul ^a,b   He, Xiaoyue ^c   Wu, Kehui ^c   Li, Yongqing ^c   Holleitner, Alexander ^a,b  

^a WALTER SCHOTTKY INSTITUT   (Germany)

^b NANOSYSTEMS INITIATIVE MUNICH NIM   (Germany)

^c INSTITUTE OF PHYSICS   (China)

Author keywords

Atomic force microscope lithography; Dynamic plowing lithography; Nanofabrication; Nanoscale optoelectronics; Photo thermoelectric current; Surface state; Topological insulator

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL POTENTIAL; INTERFACES (MATERIALS); NANOTECHNOLOGY; PHOTOCURRENTS; STRONTIUM TITANATES; SURFACE STATES; THERMOELECTRICITY;

ATOMIC FORCE MICROSCOPE LITHOGRAPHY; LONG RANGES; NANO SCALE; PHOTO-THERMOELECTRIC; PHOTOCURRENT SPECTROSCOPY; POTENTIAL FLUCTUATIONS; SUBMICRON; TOPOLOGICAL INSULATORS;

ELECTRIC INSULATORS;

EID: 84953327127     PISSN: None     EISSN: 20531583     Source Type: Journal    
DOI: 10.1088/2053-1583/2/2/024012     Document Type: Article

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