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Physical Review B - Condensed Matter and Materials Physics

Volumn 87, Issue 11, 2013, Pages

Scanning tunneling microscopy of gate tunable topological insulator Bi 2Se3 thin films

(5) Zhang, Tong a,b Levy, Niv a Ha, Jeonghoon a,b,c Kuk, Young c Stroscio, Joseph A a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b UNIVERSITY OF MARYLAND (United States)

c Seoul National University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84875310705 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.87.115410 Document Type: Article

Times cited : (37)

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