Performance comparison of VLV, ULV, and ECR tests [biomedical IC product]

Proceedings of the IEEE VLSI Test Symposium

Volumn 2002-January, Issue , 2002, Pages 31-36

  Jiang, Wanli ^a   Peterson, E ^a  

^a BOSTON SCIENTIFIC CORPORATION   (United States)

Author keywords

Biomedical engineering; Circuit faults; Circuit testing; Current measurement; Energy consumption; Integrated circuit testing; Logic testing; Manufacturing; Power engineering and energy; Voltage

Indexed keywords

BIOMEDICAL ENGINEERING; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POTENTIAL; ENERGY UTILIZATION; INTEGRATED CIRCUIT TESTING; MANUFACTURE; VLSI CIRCUITS;

CIRCUIT FAULTS; CIRCUIT TESTING; EFFECTIVENESS ANALYSIS; EFFECTIVENESS AND EFFICIENCIES; ENERGY CONSUMPTION RATIOS; LOGIC TESTING; PERFORMANCE COMPARISON; POWER ENGINEERING AND ENERGIES;

ELECTRONIC EQUIPMENT TESTING;

EID: 84948420320     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2002.1011107     Document Type: Conference Paper

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