Analysis of the delay defect detection capability of the ECR test method

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 1060-1069

  Kim, Seonki ^a   Chakravarty, Sreejit ^a   Vinnakota, Bapiraju ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEFECTS; ELECTRIC CURRENTS; ELECTRIC POWER SUPPLIES TO APPARATUS;

DELAY DEFECT DETECTION; ENERGY CONSUMPTION RATIO TEST; RESISTIVE BRIDGES; RESISTIVE OPENS;

DESIGN FOR TESTABILITY;

EID: 0034478807     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)