Experimental results for IDDQ and VLV testing

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 118-123

  Chang, J T Y ^a   Tseng, Ch W ^a   Chu, Y Ch ^a   Wattal, S ^a   Purtell, M ^a   McCluskey, E J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DESIGN FOR TESTABILITY; ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS;

DEFECT CLASSES;

VLSI CIRCUITS;

EID: 0032319930     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)