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Proceedings - 2000 IEEE International Workshop on Defect Based Testing

Volumn , Issue , 2000, Pages 57-61

Charge based testing (CBT) of submicron CMOS SRAMs

(5) Rosales, M a De Paul I a Segura, J a Hawkins, C F b,c Soden, J c

a UNIVERSITAT DE LES ILLES BALEARS (Spain)

b UNIVERSITY OF NEW MEXICO (United States)

c SANDIA NATIONAL LABORATORIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC NETWORK ANALYSIS; TESTING;

SUBMICRON; SUBMICRON CMOS; TRANSIENT CIRCUITS; TRANSIENT CURRENT;

RECONFIGURABLE HARDWARE;

EID: 84961872971 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/DBT.2000.843691 Document Type: Conference Paper

Times cited : (5)

References (11)

1
- 0029519859
- Transient power supply current testing of digital CMOS circuits
- November
- R. Makki, S. Su, and T. Nagle. "Transient power supply current testing of digital CMOS circuits". Int. Test Conf., pages 892-901, November 1995.
- (1995) Int. Test Conf. , pp. 892-901
- Makki, R.¹ Su, S.² Nagle, T.³

2
- 0033333871
- Transient current testing of 0.25μm CMOS devices
- Sept
- B. Kruseman, P. Janssen, and V. Zieren. "Transient current testing of 0.25μm CMOS devices". Int. Test Conf., pages 47-56, Sept. 1999.
- (1999) Int. Test Conf. , pp. 47-56
- Kruseman, B.¹ Janssen, P.² Zieren, V.³

3
- 0033314416
- Defect detection using power supply-transient signal analysis
- Sept
- A. Germida, Z. Yan, F. Plusquellic, and F. Muradali. "Defect detection using power supply-transient signal analysis". Int. Test Conf., pages 67-76, Sept. 1999.
- (1999) Int. Test Conf. , pp. 67-76
- Germida, A.¹ Yan, Z.² Plusquellic, F.³ Muradali, F.⁴

4
- 0031249632
- Monitoring power dissipation or fault detection
- October
- B. Vinnakota. "Monitoring power dissipation or fault detection". Journal of Electronic Testing: Theory and Applications, 11(2):173-181, October 1997.
- (1997) Journal of Electronic Testing: Theory and Applications , vol.11 , Issue.2 , pp. 173-181
- Vinnakota, B.¹

5
- 0031342923
- DD pulse response testing applied to complex CMOS ICs
- November
- DD pulse response testing applied to complex CMOS ICs". Int. Test Conf., pages 32-39, November 1997.
- (1997) Int. Test Conf. , pp. 32-39
- Beasley, J.¹ Righter, A.² Apodaca, C.³ Pour-Mozafari, S.⁴ Huggett, D.⁵

6
- 0031375455
- DDT) analysis for detecting IC defects
- November
- DDT) analysis for detecting IC defects". Int. Test Conf., pages 23-31, November 1997.
- (1997) Int. Test Conf. , pp. 23-31
- Cole, E.¹ Soden, J.² Tangyunyong, P.³ Candelaria, P.⁴ Beegle, R.⁵ Barton, D.⁶ Henderson, C.⁷ Hawkins, C.⁸

7
- 0028514878
- Built-in dynamic current sensor circuit for digital VLSI CMOS testing
- Sept
- J.A. Segura, M. Roca, D. Mateo, and A. Rubio. "Built-in dynamic current sensor circuit for digital VLSI CMOS testing". IEE Electronics Letters, 30(20):1668-1669, Sept. 1994.
- (1994) IEE Electronics Letters , vol.30 , Issue.20 , pp. 1668-1669
- Segura, J.A.¹ Roca, M.² Mateo, D.³ Rubio, A.⁴

8
- 0344210994
- Experimental analysis of transient current testing based on charge observation
- March
- J. Segura, I. De Paúl, M. Roca, E. Isern, and C. Hawkins. "Experimental analysis of transient current testing based on charge observation". IEE Electronics Letters, 35(2):441-443, March 1999.
- (1999) IEE Electronics Letters , vol.35 , Issue.2 , pp. 441-443
- Segura, J.¹ De Paúl, I.² Roca, M.³ Isern, E.⁴ Hawkins, C.⁵

9
- 0029289199
- DDQ and voltage testing
- June
- DDQ and voltage testing". Journal of Electronic Testing: Theory and Applications, 6:191-202, June 1995.
- (1995) Journal of Electronic Testing: Theory and Applications , vol.6 , pp. 191-202
- Sachdev, M.¹

10
- 0031257253
- A detailed analysis of CMOS SRAM's with gate oxide shorts
- Oct
- J. Segura and A. Rubio. "A detailed analysis of CMOS SRAM's with gate oxide shorts". IEEE Journal of Solid State Circuits, 32(10):1543-1550, Oct. 1997.
- (1997) IEEE Journal of Solid State Circuits , vol.32 , Issue.10 , pp. 1543-1550
- Segura, J.¹ Rubio, A.²

11
- 0031334139
- DDQ testing for submictron CMOS IC technology qualification
- Nov
- DDQ Testing, pages 52-56, Nov. 1997.
- (1997) DDQ Testing , pp. 52-56
- Soden, J.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.