Testing for tunneling opens

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 85-94

  Li, James C M ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN TESTS; COST EFFECTIVE SCREENING STRATEGY; TUNNELING OPEN FAILURE MODE; VERY LOW VOLTAGE TESTING;

CALCULATIONS; ELECTRIC FAULT CURRENTS; ELECTRIC POTENTIAL; ELECTRON TUNNELING; GATES (TRANSISTOR); HOT CARRIERS; INTEGRATED CIRCUIT TESTING; OXIDES; TEMPERATURE;

CMOS INTEGRATED CIRCUITS;

EID: 0034481913     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)