Optical and RF transparent protective alumina thin films

Journal of Materials Science: Materials in Electronics

Volumn 26, Issue 12, 2015, Pages 9707-9716

  Esther, A Carmel Mary ^a,c   Sridhara, N ^a   Sebastian, Shaji V ^a   Bera, Parthasarathi ^b   Anandan, Chinnasamy ^b   Aruna, Singanahalli T ^b   Rangappa, Dinesh ^c   Sharma, Anand Kumar ^a   Dey, Arjun ^a  

^a INDIAN SPACE RESEARCH ORGANISATION   (India)

^b SURFACE ENGINEERING DIVISION   (India)

^c VISVESVARAYA TECHNOLOGICAL UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; FIELD EMISSION MICROSCOPES; GERMANIUM; MAGNETRON SPUTTERING; OPTICAL FILMS; OPTICAL PROPERTIES; POLYIMIDES; SATELLITE ANTENNAS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

ALUMINA THIN FILMS; CHEMICAL DEGRADATION; COMMUNICATIONS SATELLITE; DEGRADATION BEHAVIOR; ELECTRONIC CHARACTERISTICS; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; RF MAGNETRON SPUTTERING TECHNIQUE; THERMO-OPTICAL PROPERTIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84948121757     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-015-3638-3     Document Type: Article

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