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Volumn 301, Issue 1-2, 1997, Pages 17-22

Electrical and structural characteristics of chromium thin films deposited on glass and alumina substrates

Author keywords

Chromium; Electrical properties and measurements; Resistivity; Structural properties

Indexed keywords

ALUMINA; CHROMIUM; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON BEAMS; GLASS; METALLIC FILMS; SPUTTER DEPOSITION; SURFACE ROUGHNESS;

EID: 0031152740     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09553-3     Document Type: Article
Times cited : (55)

References (22)
  • 14
    • 0346565822 scopus 로고
    • M.Sc. Thesis, Michigan Technological University
    • L.C. Chang, M.Sc. Thesis, Michigan Technological University, 1992.
    • (1992)
    • Chang, L.C.1
  • 15
    • 0011418440 scopus 로고
    • G. Hass and R.E. Thun (eds.), Academic Press, New York
    • D.C. Larson, in G. Hass and R.E. Thun (eds.), Physics of Thin Films, Academic Press, New York, 1971, pp. 81-149.
    • (1971) Physics of Thin Films , pp. 81-149
    • Larson, D.C.1
  • 16
    • 0004277028 scopus 로고
    • McGraw-Hill Book Company, Boston, MA
    • K.L. Chopra, Thin Film Phenomena, McGraw-Hill Book Company, Boston, MA, 1969, pp. 328-433.
    • (1969) Thin Film Phenomena , pp. 328-433
    • Chopra, K.L.1
  • 17
    • 0345934599 scopus 로고
    • R.M. Chapman, Vacuum, 13 (1963) 213-221.
    • (1963) Vacuum , vol.13 , pp. 213-221
    • Chapman, R.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.