Microstructural studies of e-beam evaporated alumina thin films

Surface Engineering

Volumn 30, Issue 8, 2014, Pages 594-599

  Reddy, I N ^a   Reddy, V R ^b   Dey, A ^a   Sridhara, N ^a   Basavaraja, S ^c   Bera, P ^d   Anandan, C ^d   Sharma, A K ^a  

^a INDIAN SPACE RESEARCH ORGANISATION   (India)

^b SRI VENKATESWARA UNIVERSITY   (India)

^c JAWAHARLAL NEHRU CENTRE FOR ADVANCED SCIENTIFIC RESEARCH   (India)

^d SURFACE ENGINEERING DIVISION   (India)

Author keywords

Alumina; E beam evaporation; Microstructure; Nanorods; Thin film

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; FIELD EMISSION MICROSCOPES; FILM GROWTH; MICROSTRUCTURE; OPTICAL FILMS; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINA THIN FILMS; E BEAM EVAPORATION; ELECTRON BEAM EVAPORATION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; MICRO-STRUCTURAL; POST-HEAT TREATMENT; PREFERENTIAL GROWTH; RANDOM ORIENTATIONS;

NANORODS;

EID: 84904810372     PISSN: 02670844     EISSN: 17432944     Source Type: Journal    
DOI: 10.1179/1743294414Y.0000000294     Document Type: Article

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