Perimeter recombination characterization by luminescence imaging

IEEE Journal of Photovoltaics

Volumn 6, Issue 1, 2016, Pages 244-251

  Fong, Kean Chern ^a   Padilla, Milan ^b   Fell, Andreas ^a   Franklin, Evan ^a   Mcintosh, Keith R ^c   Kho, Teng Choon ^a   Blakers, Andrew W ^a   Nebel Jacobsen, Yona ^a   Surve, Sachin R ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^c PV Lighthouse   (Australia)

Author keywords

Characterization; perimeter recombination; photoluminescence; photovoltaic; silicon; simulation

Indexed keywords

LUMINESCENCE; SILICON SOLAR CELLS; SILICON WAFERS;

EFFICIENCY LOSS; LUMINESCENCE IMAGING; PERIMETER RECOMBINATION; SEMICONDUCTOR SIMULATIONS;

SOLAR CELLS;

EID: 84943423617     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2015.2480225     Document Type: Article

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