Full-field X-ray reflection microscopy of epitaxial thin-films

Journal of Synchrotron Radiation

Volumn 21, Issue 6, 2014, Pages 1252-1261

  Laanait, Nouamane ^a   Zhang, Zhan ^a   Schlepütz, Christian M ^a   Vila Comamala, Joan ^a   Highland, Matthew J ^a   Fenter, Paul ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

interfaces and thin films; materials science; X ray microscopy; X ray surface diffraction

Indexed keywords

DIFFRACTION; FILMS; INTERFACES (MATERIALS); MATERIALS SCIENCE; SURFACE SCATTERING; X RAY MICROSCOPES;

DIFFRACTION CONTRAST; EPITAXIAL THIN FILMS; OPTICAL CONFIGURATIONS; RAY SURFACES; SPATIAL RESOLUTION; STRUCTURAL DOMAINS; X RAY MICROSCOPY; X RAY REFLECTION;

THIN FILMS;

EID: 84942908248     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577514016555     Document Type: Article

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