Reciprocal space mapping of phase transformation in epitaxial PbTiO3 thin films using synchrotron x-ray diffraction

Journal of Applied Physics

Volumn 85, Issue 3, 1999, Pages 1995-1997

  Lee, K S ^a   Baik, S ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001395416     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369195     Document Type: Article

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