Angle calculations for a (2+3)-type diffractometer: Focus on area detectors

Journal of Applied Crystallography

Volumn 44, Issue 1, 2011, Pages 73-83

  Schlepütz, Christian M ^a,c   Mariager, Simon O ^b   Pauli, Stephan A ^a   Feidenhansl, Robert ^b   Willmott, Philip R ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF COPENHAGEN   (Denmark)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

angle calculations; diffractometers; grazing incidence diffraction; pixel detectors; reciprocal space mapping; surface diffraction

Indexed keywords

ANGLE CALCULATIONS; GRAZING INCIDENCE; PIXEL DETECTORS; SPACE MAPPINGS; SURFACE DIFFRACTION;

DETECTORS; DIFFRACTOMETERS; PIXELS; READOUT SYSTEMS; TWO DIMENSIONAL; X RAY DIFFRACTION;

DIFFRACTION;

EID: 79251498917     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810048922     Document Type: Article

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