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Volumn 26, Issue 2, 2013, Pages 2-3
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X-ray Microscopy and Microtomography
a b c
b
ALS
*
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84875866808
PISSN: 08940886
EISSN: 19317344
Source Type: Journal
DOI: 10.1080/08940886.2013.771061 Document Type: Editorial |
Times cited : (1)
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References (5)
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