Structural and XPS studies of PSi/TiO2 nanocomposites prepared by ALD and Ag-assisted chemical etching

Applied Surface Science

Volumn 347, Issue , 2015, Pages 777-783

  Iatsunskyi, Igor ^a   Kempiński, Mateusz ^a   Nowaczyk, Grzegorz ^a   Jancelewicz, Mariusz ^a   Pavlenko, Mykola ^b   Załeski, Karol ^a   Jurga, Stefan ^a  

^a ADAM MICKIEWICZ UNIVERSITY   (Poland)

^b ODESSA NATIONAL UNIVERSITY   (Ukraine)

Author keywords

Atomic layer deposition; Dioxide titanium; Nanocompositesa; Porous silicon; XPS

Indexed keywords

ATOMIC LAYER DEPOSITION; BINDING ENERGY; CHEMICAL ANALYSIS; ELECTRONIC STRUCTURE; ENERGY DISPERSIVE SPECTROSCOPY; ETCHING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MORPHOLOGY; NANOCOMPOSITES; OXIDE MINERALS; POROUS SILICON; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON COMPOUNDS; SPECTRUM ANALYSIS; SURFACE DEFECTS; TITANIUM DIOXIDE; VALENCE BANDS; X RAY PHOTOELECTRON SPECTROSCOPY; PHASE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

BINDING ENERGY ANALYSIS; ELEMENTAL COMPOSITIONS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; METAL-ASSISTED CHEMICAL ETCHING; NANOCOMPOSITESA; TIO2 NANOCRYSTALS; VALENCE BAND ANALYSIS; VALENCE BAND SPECTRA; CHEMICAL ETCHING;

TITANIUM METALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84940888294     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2015.04.172     Document Type: Article

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