Effects of electron beam irradiation on the photoelectrochemical properties of TiO 2 film for DSSCs

Radiation Physics and Chemistry

Volumn 81, Issue 8, 2012, Pages 954-957

  Kim, Hyun Bin ^a   Park, Dong Won ^b   Jeun, Joon Pyo ^a   Oh, Seung Hwan ^a   Nho, Young Chang ^a   Kang, Phil Hyun ^a  

^a Korea Atomic Energy Research Institute   (South Korea)

^b Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

Dye sensitized solar cell; Electron beam irradiation; TiO 2 film

Indexed keywords

BEAM CURRENTS; CRYSTALLINITIES; DOSE RATE; DYE-SENSITIZED SOLAR CELL; DYE-SENSITIZED SOLAR CELLS; ELECTRON BEAM IRRADIATION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; LOW DOSE; NANOSTRUCTURED TIO; OVERALL EFFICIENCY; PHOTOCHEMICAL CELLS; PHOTOELECTROCHEMICAL PROPERTIES; SIMULATED SUNLIGHT; TIO;

CONVERSION EFFICIENCY; ELECTRON BEAMS; ENAMELS; FILM PREPARATION; INDUSTRIAL APPLICATIONS; IRRADIATION; PHOTOELECTROCHEMICAL CELLS; PHOTOELECTRONS; RADIATION; SOLAR CELLS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

TITANIUM DIOXIDE;

NANOCRYSTAL; NANOMATERIAL; TITANIUM DIOXIDE;

ACCELERATION; ARTICLE; CELL TYPE; CHEMICAL ANALYSIS; CHEMICAL MODIFICATION; CONTROLLED STUDY; DYE SENSITIZED SOLAR CELL; ELECTRIC CURRENT; ELECTRON BEAM; ELECTRON TRANSPORT; ENERGY CONVERSION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FILM; ILLUMINATION; OXYGEN TRANSPORT; PARTICLE SIZE; PHOTOCHEMISTRY; PHYSICAL CHEMISTRY; RADIATION DOSE; RADIATION ENERGY; STRUCTURE ANALYSIS; SURFACE CHARGE; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84862792209     PISSN: 0969806X     EISSN: 18790895     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2011.11.064     Document Type: Article

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