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Volumn 105, Issue 2-3, 1999, Pages 211-218

Removal of inelastic scattering part from Ti2p XPS spectrum of TiO2 by deconvolution method using O1s as response function

Author keywords

Deconvolution; Electron energy loss spectrum; In situ fractured surface; O1s XPS spectrum; Ti2p XPS spectrum; TiO2

Indexed keywords


EID: 0004864287     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(99)00067-5     Document Type: Article
Times cited : (66)

References (20)
  • 1
    • 0000503141 scopus 로고
    • Practical Surface Analysis
    • D. Briggs, M.P. Seah (Eds.), John Siley and Sons, Chichester, New York, Brisbane, Toronto, Singapore, Chapter 5
    • M.P. Seah, Practical Surface Analysis, in: D. Briggs, M.P. Seah (Eds.), Second edition, Auger and Photoelectron Spectroscopy, Vol. 1, John Siley and Sons, Chichester, New York, Brisbane, Toronto, Singapore, 1990, p. 201, Chapter 5.
    • (1990) Second Edition, Auger and Photoelectron Spectroscopy , vol.1 , pp. 201
    • Seah, M.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.