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Volumn 114, Issue 22, 2015, Pages

Interfacial Charge States in Graphene on SiC Studied by Noncontact Scanning Nonlinear Dielectric Potentiometry

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; CARBON; DANGLING BONDS; DIELECTRIC DEVICES; GRAPHENE; HYDROGEN; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SILICON CARBIDE;

EID: 84935925787     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.114.226103     Document Type: Article
Times cited : (31)

References (43)
  • 26
    • 15844374816 scopus 로고    scopus 로고
    • NNOTER
    • K. Ohara and Y. Cho, Nanotechnology 16, S54 (2005). NNOTER 0957-4484 10.1088/0957-4484/16/3/010
    • (2005) Nanotechnology , vol.16 , pp. S54
    • Ohara, K.1    Cho, Y.2
  • 28
    • 84935895621 scopus 로고    scopus 로고
    • See Supplemental Material at for a brief review on NC-SNDP, the details of the correlation between topographic and potential images, and the details of potentials on pristine BLG, which includes Refs. [29,30]
    • See Supplemental Material at http://link.aps.org/supplemental/10.1103/PhysRevLett.114.226103 for a brief review on NC-SNDP, the details of the correlation between topographic and potential images, and the details of potentials on pristine BLG, which includes Refs. [29,30].
  • 41
    • 35948989303 scopus 로고    scopus 로고
    • PRLTAO
    • Y. Cho and R. Hirose, Phys. Rev. Lett. 99, 186101 (2007). PRLTAO 0031-9007 10.1103/PhysRevLett.99.186101
    • (2007) Phys. Rev. Lett. , vol.99 , pp. 186101
    • Cho, Y.1    Hirose, R.2
  • 43
    • 84872083731 scopus 로고    scopus 로고
    • JAPIAU
    • K. Yamasue and Y. Cho, J. Appl. Phys. 113, 014307 (2013). JAPIAU 0021-8979 10.1063/1.4772705
    • (2013) J. Appl. Phys. , vol.113 , pp. 014307
    • Yamasue, K.1    Cho, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.